Semiconductor device and manufacturing method thereof

ABSTRACT

A semiconductor device includes an insulator layer, and an n-channel MIS transistor having an n channel and a pMIS transistor having a p channel which are formed on the insulator layer, wherein the n channel of the n-channel MIS transistor is formed of an Si layer having a uniaxial tensile strain in a channel length direction, the p channel of the p-channel MIS transistor is formed of an SiGe or Ge layer having a uniaxial compressive strain in the channel length direction, and the channel length direction of each of the n-channel MIS transistor and the p-channel MIS transistor is a &lt;110&gt; direction.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application is a divisional of U.S. application Ser. No.11/950,716, filed on Dec. 5, 2007 now U.S. Pat. No. 8,008,751, nowpending, which is based upon and claims the benefit of priority fromprior Japanese Patent Application No. 2006-332020, filed Dec. 8, 2006,the entire contents of which are incorporated herein by reference.

BACKGROUND OF THE INVENTION

1. Field of the Invention

The present invention relates to a semiconductor device in which ann-channel MIS transistor and a p-channel MIS transistor are formed onthe same substrate, and a manufacturing method thereof.

2. Description of the Related Art

An improvement in performance of a CMOS circuit has been achieved byminiaturization of an MISFET based on a scaling law. However, in thepresent day, a gate length is 50 nm or below, which raises variousproblems due to miniaturization. Therefore, in order to further improvethe performance of a CMOS circuit, a technology of increasing a mobilityof a channel as well as miniaturization is required. As means forincreasing the mobility, a method of applying a strain to a channel, amethod of using a plane orientation different from a regular (100)surface, or a method of using SiGe or Ge as a high-mobility material fora channel has been proposed.

On the other hand, suppression of an short channel effect is the mostimportant problem in an extremely scaled MISFET, and a multi-gate MISFETsuperior in immunity of short channel effects has attracted attention inrecent years. In the multi-gate MISFET, since a controlling power of agate is increased as compared with a conventional planar MISFET, theshort channel effect is suppressed. Therefore, it can be considered thatappropriate integration of the mobility enhancement technologies andthese multi-gate MISFETs is important to realize a lower powerconsumption/high-performance CMOS in the future.

However, in order to obtain a high mobility for both an nMISFET and apMISFET in a CMOS structure using the multi-gate MISFET, it has beenconventionally considered that current directions must be changeddepending on the nMISFET and the pMISFET (see, e.g., JP-A 2001-160594(KOKAI)). That is, in the case of using a regular (001) substrate, a Finside surface is a (100) surface when a current direction is a <100>direction, and the Fin side surface is a (110) surface when the currentdirection is a <110> direction. On the other hand, mobilities ofelectrons and holes vary depending on respective surfaces, and themobility of electrons has a relationship of (100)>(110), and themobility of holes has a relationship of (100)<(110). Therefore, thecurrent direction must be set to the <100> direction in the nMISFET, andthe current direction must be set to the <110> direction in the pMISFET.In order to set such current directions, a device direction of thenMISFET must be inclined 45° with respect to a device direction of thepMISFET, and there is a problem of an area penalty or complication of acircuit design.

Further, although using a single semiconductor layer as a material isdesirable for fabrication of the multi-gate MISFET in terms of ascalability of the Fin, a method of using the single semiconductor layerto uniformly apply a tensile strain to the nMISFET in the currentdirection and a compressive strain to the pMISFET in the currentdirection has not been realized yet.

As explained above, it has been conventionally considered that devicedirections of the nMISFET and the pMISFET must be inclined by 45°, theFin side surface must be set as a (100) surface in the nMISFET, and theFin side surface must be set as a (110) surface in the pMISFET in orderto optimize plane orientations and strains in both the nMISFET and thepMISFET in the multi-gate CMOS structure. However, this structure has aproblem of an area penalty or complication of a circuit design.Furthermore, using a single semiconductor layer to uniformly apply anoptimum strain to each of the nMISFET and the pMISFET is difficult.

Therefore, realization of a semiconductor device having the multi-gateCMOS structure that can improve a mobility of each device withoutinclining device directions in the nMISFET and the pMISFET and amanufacturing method thereof is demanded.

BRIEF SUMMARY OF THE INVENTION

According to a first aspect of the invention, there is provided asemiconductor device, which includes: an insulator layer; and ann-channel MIS transistor having an n channel and a pMIS transistorhaving a p channel which are formed on the insulator layer, wherein then channel of the n-channel MIS transistor is formed of an Si layerhaving a uniaxial tensile strain in a channel length direction, the pchannel of the p-channel MIS transistor is formed of an SiGe or Ge layerhaving a uniaxial compressive strain in the channel length direction,and the channel length direction of each of the n-channel MIS transistorand the p-channel MIS transistor is a <110> direction.

According to a second aspect of the invention, there is provided amethod of manufacturing a semiconductor device, which includes: formingan Si layer having a biaxial tensile strain on an insulator; epitaxiallygrowing an SiGe layer on a part of the Si layer; oxidizing the SiGelayer to form an SiGe or Ge layer having a compressive strain on theinsulator; leaving the respective layers in a stripe pattern parallel toa <110> direction by etching to form a first semiconductor region madeof an Si layer having a uniaxial tensile strain in the <110> directionand a second semiconductor region made of an SiGe or Ge layer having auniaxial compressive strain in the <110> direction; forming an n-channelMIS transistor having the uniaxial tensile strain along a channel lengthdirection in the first semiconductor region; and forming a p-channel MIStransistor having the uniaxial compressive strain along a channel lengthdirection in the second semiconductor region.

BRIEF DESCRIPTION OF THE SEVERAL VIEWS OF THE DRAWING

FIG. 1 is a birds-eye view showing an outline structure of asemiconductor device according to a first embodiment;

FIGS. 2A and 2B are cross-sectional views showing the outline structureof the semiconductor device according to the first embodiment, whereFIG. 2A corresponds to a cross section taken along a line A1-A1′ in FIG.1 and FIG. 2B corresponds to a cross section taken along a line A2-A2′in FIG. 1;

FIGS. 3A and 3B are cross-sectional views showing the outline structureof the semiconductor device according to the first embodiment, whereFIG. 3A corresponds to a cross section taken along a line B1-B1′ in FIG.1 and FIG. 3B corresponds to a cross section taken along a line B2-B2′in FIG. 1;

FIGS. 4A to 4E are cross-sectional views showing a manufacturing processof the semiconductor device according to the first embodiment in stages;

FIG. 5 is a birds-eye view showing directions of stresses applied to thesemiconductor device according to the first embodiment;

FIG. 6 is a birds-eye view showing a modification of the firstembodiment;

FIGS. 7A and 7B are cross-sectional views showing an outline structureof a semiconductor device according to a second embodiment, where FIG.7A corresponds to a cross section taken along the line B1-B1′ in FIG. 1and FIG. 7B corresponds to a cross section taken along the line B2-B2′in FIG. 1;

FIGS. 8A and 8B are cross-sectional views showing an outline structureof a semiconductor device according to a third embodiment, where FIG. 8Acorresponds to a cross section taken along the line B1-B1′ in FIG. 1 andFIG. 8B corresponds to a cross section taken along the line B2-B2′ inFIG. 1; and

FIGS. 9A and 9B are cross-sectional views showing an outline structureof a semiconductor device according to a fourth embodiment, where FIG.9A corresponds to a cross section taken along the line B1-B1′ in FIG. 1and FIG. 9B corresponds to a cross section taken along the line B2-B2′in FIG. 1.

DETAILED DESCRIPTION OF THE INVENTION

In embodiments according to the present invention explained below, Sihaving a uniaxial tensile strain in a channel length direction is usedto form an nMISFET, and SiGe or Ge having a uniaxial compressive strainin a channel direction is used to form a pMISFET. As a result,mobilities can be improved in both the nMISFET and the pMISFET.Moreover, since the nMISFET and the pMISFET have the same currentdirection, a problem of an area penalty or complication of a circuitdesign does not arise.

Particulars of the present invention will now be explained hereinafterbased on illustrated embodiments.

First Embodiment

In a semiconductor device according to a first embodiment, as shown inFIG. 1, a p-type Si layer (a first semiconductor region) 10 having auniaxial tensile strain is formed in a Fin shape on a part of a buriedinsulating film 2 formed on a single-crystal Si substrate 1. This Silayer 10 is formed to extend in a <110> direction, and a direction ofthe strain is the <110> direction. Additionally, an n-type SiGe layer (asecond semiconductor region) 20 having a uniaxial compressive strain isformed in a Fin shape on a part of the insulating film 2 in parallelwith the Si layer 10. This SiGe layer 20 is also formed to extend in the<110> direction and a direction of the strain is the <110> directionlike the Si layer 10.

A first gate insulating film 11 is formed to cover an upper surface andboth side surfaces of a central part of the Si layer 10, and a firstgate electrode 12 is formed to cover this gate insulating film 11. Thegate electrode 12 is formed on not only the gate insulating film 11 butalso the insulating film 2 to extend in a direction perpendicular to the<110> direction. A gate sidewall insulating film 13 is formed on sidesurfaces of the gate electrode 12. A first source/drain region 14 isformed in a surface portion of the Si layer 10. As a result, an nMISFEThaving a Fin structure is configured.

A second gate insulating film 21 is formed to cover an upper surface andboth side surfaces of a central part of the SiGe layer 20, and a secondgate electrode 22 is formed to cover this gate insulating film 21. Thegate electrode 22 is formed on not only the gate insulating film 21 butalso the insulating film 2 to extend in a direction perpendicular to the<110> direction. A gate sidewall insulating film 23 is formed on sidesurfaces of the gate electrode 22. A second source/drain region 24 isformed in a surface portion of the SiGe layer 20. As a result, a pMISFEThaving a Fin structure is configured.

According to such a structure, a channel of the nMISFET is formed of Sihaving a uniaxial tensile strain, and a channel of the pMISFET is formedof SiGe having a uniaxial compressive strain. Further, a substrate planeorientation is (001), and both the nMISFET and the pMISFET has the samecurrent direction, i.e., the <110> direction. Therefore, a planeorientation of a channel side surface is a (110) surface.

Each of the gate insulating films 11 and 21 may be formed of SiO₂ or aninsulating film material having a higher dielectric constant than SiO₂(a high-k insulating film). For example, it is possible to use SiON,Si₃N₄, Al₂O₃, Ta₂O₅, TiO₂, La₂O₅, CeO₂, ZrO₂, HfO₂, SrTiO₃, or Pr₂O₃.Furthermore, like a Zr silicate or an Hf silicate, a material obtainedby mixing a metal ion in a silicon oxide is also effective, and acombination of these materials may be employed.

Moreover, as each of the gate electrodes 12 and 22, a material requiredin a transistor for each generation, e.g., polycrystal Si, SiGe, Ge, asilicide, a germano-silicide, or various kinds of metals can beappropriately selected and used. For the source/drain region 14 or 24, asilicide, a germano-silicide, or a germanide can be used. As the gatesidewall insulating film 13 or 23, an Si oxide film, an Si nitride film,or a laminated film including these films is desirable.

It is to be noted that a semiconductor layer remains in each of thesource/drain regions 14 and 24 in the drawing, but each of thesource/drain regions 14 and 24 may be all formed of a metal.Additionally, it is possible to adopt a so-called metal source/drainstructure in which a semiconductor layer subjected to impurity doping isnot provided between the source/drain region 14 or 24 and a channel.

A manufacturing method of the semiconductor device according to thisembodiment will now be explained with reference to FIGS. 4A to 4E.

As depicted in FIG. 4A, a single-layer strained SOI (SSOI) substratehaving an in-plane biaxial tensile strain is used as a base substrate(K. Rim et al., “Fabrication and mobility characteristics of ultra-thinstrained Si directly on insulator (SSDOI) MOSFETs,” Technical Digest ofInternational Electron Devices Meeting, p. 47-52, 2003). That is, asubstrate in which the buried insulating film 2 made of, e.g., SiO₂ isformed on the single-crystal silicon substrate 1 and a single-crystalp-type Si layer 3 having a biaxial tensile strain is formed thereon isused. In this example, a (001) surface is presumed as a substrate planeorientation. Although a fabrication method of the SSOI substrate isarbitrary, having a strain amount of 0.4% or above is desirable.Furthermore, a film thickness of the Si layer 3 is typically 10 nm orabove. Of course, an initial SSOI substrate may be subjected toepitaxial growth of Si to increase the film thickness of the Si layer 3.

As shown in FIG. 4B, the SSOI substrate is first used to deposit a maskmaterial 4 for selective epitaxial growth on the Si layer 3, andphotolithography and etching are performed to remove the mask material 4on the pMISFET region. As the mask material 4, an Si oxide film or an Sinitride film is desirable.

Then, as shown in FIG. 4C, selective growth of an n-type SiGe layer 5 iscarried out. Although a film thickness and a Ge composition of the SiGelayer 5 are arbitrary, appropriately performing adjustment in such amanner that the nMISFET and the pMISFET have the same Fin height isdesirable. For example, when a film thickness of the Si layer 3 is 50 nmand a Ge concentration in the pMISFET region is 50%, assuming that a Geconcentration in the SiGe layer to be selectively grown is 20%, a filmthickness of the SiGe layer 5 is 125 nm. It is to be noted thatsuccessively growing an Si layer 6 of 1 nm or above after growth of theSiGe layer 5 is desirable. That is because oxidation processing isperformed at the next step but directly oxidizing the SiGe layer 5 mayresult in surface roughness.

Then, as shown in FIG. 4D, oxidation processing is carried out whileleaving the mask material 4 in the nMISFET region. Although an oxidizingatmosphere does not have to be 100% oxygen, a dry atmosphere is adopted.Moreover, an oxidizing temperature is a temperature which does notexceed a fusing point of SiGe in the Fin. Of course, the oxidizingtemperature and oxidizing gas partial pressure do not have to be fixedduring oxidation, and they may be appropriately adjusted.

When the SiGe layer 5 is oxidized in the dry atmosphere, Si isselectively oxidized to form an oxide film 7, and Ge is condensed into abase semiconductor (T. Tezuka et al., “A novel fabrication technique ofultrathin and relaxed SiGe buffer layers with high Ge fraction forSub-100 nm strained silicon-on-insulator MOSFETs,” Japanese Journal ofApplied Physics, vol. 40, p. 2866-2874, 2001). That is, the Gecomposition in the pMISFET region is increased with progress ofoxidation. Additionally, since Ge atoms are diffused in thesemiconductor layer during oxidation, the Ge composition can beuniformed in a thickness direction.

That is, the pMISFET region can be substituted by an SiGe layer 8 (anSiGe on Insulator: SGOI) layer having a high Ge concentration while thenMISFET region remains as the SSOI. Further, when the final Gecomposition is set to satisfy the following conditions, a compressivestrain can be applied to the SGOI layer. As the conditions, an in-plainlattice constant in the case of no strain in the SGOI layer must belarger than an in-plane lattice constant of the base SSOI substrate.

Then, as shown in FIG. 4E, the mask material 4 in the nMISFET region andthe oxide film 7 in the pMISFET region are removed after formation ofthe SGOI layer. As a result, the p-type Si layer 3 having the biaxialtensile strain and the n-type SiGE layer 8 having the biaxialcompressive strain can be formed on the insulating film 2.

In the thus fabricated substrate, as shown in a birds-eye view of FIG.5, the Fin serving as an active region of the multi-gate MISFET isformed. That is, the stripe p-type Si layer 10 having a uniaxial tensilestrain in the <110> direction is formed in the nMISFET forming region,and the stripe n-type SiGe layer 20 having a uniaxial compressive strainin the <110> direction is formed in the pMISFET region.

The Fin may be fabricated by processing a mask material based on regularphotolithography or electron beam lithography and then effectinganisotropic etching. Furthermore, it is possible to adopt a so-calledsidewall transfer (SWT) process of forming a sidewall on a dummy memberon the substrate and utilizing this sidewall as a mask for Fin formation(Y.-K Choi et al, “Sub-20 nm CMOS FinFET technologies,” Technical Digestof International Electron Devices Meeting, p. 421-424, 2001), but theforming method is not limited to such.

As a width of the Fin, a range of 5 nm to 500 nm is desirable. That isbecause the Fin is apt to fall and subsequent device fabrication becomesdifficult when the width of the Fin is shorter than 5 nm and theuniaxial strain cannot be provided when the width of the Fin exceeds 500nm.

In regard to a direction of the Fin, a longitudinal direction is set tothe <110> direction so that a current direction becomes the <110>direction. It is known that a strain in a narrow side is relaxed whenthe fine mesa structure is formed in this manner (T. Irisawa et al.,“High current drive uniaxially-strained SGOI pMOSFETs fabricated bylateral strain relaxation technique,” VLSI Technology 2005, Digest ofTechnical Papers, p. 178-179, 2003, and T. Lei et al., “Strainrelaxation in patterned strained silicon directly on insulatorstructures,” Applied Physics Letters, vol. 87, p. 2338-2340, 2006).Consequently, as shown in FIG. 5, the uniaxial tensile strain in thecurrent direction is applied to a channel of the nMISFET, and theuniaxial compressive strain in the current direction is applied to achannel of the pMISFET.

In the pMISFET, the uniaxial compressive strain in the current directionis an optimum strain direction in both the (001) surface/<110> directionof the upper surface of the Fin and the (110) surface/<110> direction ofthe side surface of the same (H. Irie et al., “In-plane mobilityanisotropy and universality under uni-axial strains in n- and p-MOSinversion layers on (100), (110), and (111) Si,” Technical Digest ofInternational Electron Devices Meeting, p. 225-228, 2004). Moreover,since a hole mobility on the (110) surface/<110> direction is higherthan a hole mobility on the (100) surface, a very high mobility isrealized in a multi-gate SGOI-pMISFET fabricated by this method (T.Irisawa et al., “High performance multi-gate pMOSFETs usinguniaxially-strained SGOI channels,” Technical Digest of InternationalElectron Devices Meeting, p. 727-730, 2005).

On the other hand, in the nMISFET having the uniaxial tensile strain inthe current direction, a high mobility can be likewise expected for thefollowing reasons. First, in the (001) surface/<110> direction of theupper surface, an effect is smaller than that in the case of the biaxialtensile strain when the strain is small, but a larger increase in amobility can be expected than that in the biaxial tensile strain whenthe strain is large (0.8% or above) (K. Uchida et al., “Physicalmechanisms of electron mobility enhancement in uniaxial stressed MOSFETsand impact of uniaxial stress engineering in ballistic regime,”Technical Digest of International Electron Devices Meeting, p. 135-138,2005). That is because, when the uniaxial strain in the <110> directionis applied, an effect of suppressing phonon scattering due to bandsplitting of 6-fold degenerate conduction band valleys is obtained andan effective mass in the <110> direction of electrons in 2-folddegenerate conduction band valleys occupied by many electrons isreduced.

Additionally, in the (110) surface/<110> direction of the side surface,when no strain is applied, since electrons occupy more 4-fold degenerateconduction band valleys having a large effective mass in the <110>direction, a mobility is reduced as compared with the (001) surface.However, when the uniaxial tensile strain is applied in the <110>direction, the 2-fold degenerate conduction band valleys having a smalleffective mass in the <110> direction are energetically lowered, andelectrons preferentially occupy the 2-fold degenerate conduction bandvalleys, thereby greatly increasing the mobility. In this case, sincethe effective mass in the <110> direction of the 2-fold degenerateconduction band valleys is likewise reduced, it can be considered thatthe uniaxial tensile strain in the <110> direction has an optimum straindirection when the strain is also large on the (110) surface like the(001) surface.

As explained above, according to the structure of this embodiment, theplane orientation and the strain direction are optimized in both thenMISFET and the pMISFET, and the nMISFET and the pMISFET have the samecurrent direction. As a result, it is possible to realize the multi-gateCMOS structure which does not lead to an area penalty or complication ofa circuit design while improving the mobility.

Thereafter, a semiconductor device having such a multi-gate CMOSstructure as shown in FIG. 1 can be fabricated through regular fineMISFET fabricating processes, i.e., formation of the gate insulatingfilms 11 and 21, formation of the gate electrodes 12 and 22, formationof an extension doping layer, formation of the gate sidewall insulatingfilms 13 and 23, and formation of the source/drain regions 14 and 24.

As explained above, according to this embodiment, the multi-gate CMOSformed of the Si-nMISFET having the uniaxial tensile strain and the SGOI(GOI)-pMISFET having the uniaxial compressive strain can be realized.Further, in this case, the plane orientation and the strain directionare optimized in both the nMISFET and the pMISFET, and the nMISFET andthe pMISFET have the same current direction. As a result, a drivingforce can be improved without an area penalty or complication of acircuit design.

It is to be noted that the plane orientation of the base substrate is(001) in this embodiment, but the present invention is likewiseeffective when the plane orientation of the base substrate is the (110)surface. In this case, as shown in FIG. 6, the upper surface of the Finis the (110) surface, and the side surface of the Fin is the (001)surface. In this case, likewise, an increase in mobility due to a straincan be obtained in both the nMISFET and the pMISFET of both a multi-gateMISFET and a planar MISFET for the same reason as that in the case usingthe (001) substrate.

Second Embodiment

FIGS. 7A and 7B are cross-sectional views showing a device structure ofa semiconductor device having a multi-gate CMOS structure according to asecond embodiment of the present invention. It is to be noted that likereference numerals denote parts equal to those in FIGS. 3A and 3B,thereby omitting a detailed explanation thereof.

The embodiment of the tri-gate MISFET in which the upper surface and theside surfaces of the Fin are used as the channels has been explained inthe first embodiment. The second embodiment shows fabrication of a gateall-around MISFET in which an entire Fin is covered with a gate.

In this embodiment, a Fin is formed in each of an nMISFET forming regionand a pMISFET forming region as shown in FIG. 5, and then a buried oxidefilm 2 under a channel of each Fin is removed by wet etching.Thereafter, a first gate insulating film 11 and a first gate electrode12 are formed to surround the entire channel in the nMISFET formingregion, and a second gate insulating film 21 and a second gate electrode22 are formed to surround the entire channel in the pMISFET formingregion.

Even if such a structure is adopted, the same effect as that in thefirst embodiment can be obtained. Further, since the gate all-aroundstructure is adopted, a controlling power of the gate electrodes overthe channels can be further increased.

Third Embodiment

FIGS. 8A and 8B are cross-sectional views showing a device structure ofa semiconductor device having a multi-gate CMOS structure according to athird embodiment of the present invention. It is to be noted that likereference numerals denote parts equal to those in FIG. 3, therebyomitting a detailed explanation thereof.

This embodiment shows fabrication of a double-gate MISFET using bothside surfaces alone of a Fin as channels.

In this embodiment, gate insulating films 11 and 21 and gate electrodes12 and 22 are formed in a state where mask materials 16 and 26 (e.g., Sinitride films) used to form Fins are left on Fin upper surfaces. As aresult, the upper surfaces of the Fins are not controlled by the gateelectrodes 12 and 22, thus fabricating the double-gate MISFET.

Even if such a structure is adopted, the same effect as that in thefirst embodiment can be obtained. Moreover, in this embodiment, since ahole mobility has a relationship of (110)>(100), an effect of increasingthe mobility can be obtained in a pMISFET as compared with a tri-gatestructure.

Additionally, in this embodiment, forming each of the mask materials 16and 26 with a large thickness enables electrically isolating the gateelectrodes 12 and 22 on both sides of the Fins, thereby independentlycontrolling right and left channels based on the double gate.

Fourth Embodiment

FIGS. 9A and 9B are cross-sectional views showing a device structure ofa semiconductor device having a multi-gate CMOS structure according to afourth embodiment of the present invention. It is to be noted that likereference numerals denote parts equal to those in FIG. 3, therebyomitting a detailed explanation thereof.

This embodiment shows a case where the present invention is applied to aregular planar MISFET using Fin upper surfaces alone as channels.

In this embodiment, a Fin is formed in each of an nMISFET forming regionand a pMISFET forming region as shown in FIG. 5, and then a deviceisolation process, e.g., regular STI (Shallow Trench Isolation) iscarried out to bury and flatten each of device isolation insulatingfilms 18 and 28 in both side surfaces of each Fin and to expose theupper surfaces alone of the respective Fins. Subsequently, in thenMISFET forming region, a first gate insulating film 11 is formed on anupper surface of an Si layer 10, and a second gate electrode 12 isformed on the first gate insulating film 11 and the buried insulatingfilm 18. Further, in the pMISFET forming region, a first gate insulatingfilm 21 is formed on an upper surface of an SiGe layer 20, and a secondgate electrode 22 is formed on the first gate insulating film 21 and theburied insulating film 28.

If such a structure is adopted, a plane orientation and a straindirection are optimized in each of the nMISFET and the pMISFET, and theplanar CMOS structure in which current directions are equal to eachother can be realized.

(Modification)

It is to be noted that the present invention is not restricted to therespective foregoing embodiments. Although the example where each of thenMISFET and the pMISFET is constituted of one Fin has been explained inthe embodiments, the present invention is effective for each MISFETconstituted of a plurality of Fins. Furthermore, the secondsemiconductor region is not restricted to SiGe, and Ge may be used.Moreover, the base substrate of the buried insulating film is notnecessarily restricted to the single-crystal Si substrate, and variouskinds of semiconductor substrates can be used.

Additionally, although Si is of the p type and SiGe or Ge is of the ntype in the embodiments, the conductivity types of the first and secondsemiconductor regions are not necessarily restricted, and an intrinsicsemiconductor having no impurity doped therein may be used.

Additional advantages and modifications will readily occur to thoseskilled in the art. Therefore, the invention in its broader aspects isnot limited to the specific details and representative embodiments shownand described herein. Accordingly, various modifications may be madewithout departing from the spirit or scope of the general inventiveconcept as defined by the appended claims and their equivalents.

1. A semiconductor device comprising: an insulator layer; a firstsemiconductor region formed in a linear shape having two side surfaces,an upper surface and a lower surface along a <110> direction on theinsulator layer, one of the upper surface and each of the two sidesurfaces having a (110) surface, and the first semiconductor regionbeing made of Si having a uniaxial tensile strain in the <110>direction; an n-channel MIS transistor formed in the first semiconductorregion, the n-channel MIS transistor including a first gate electrodeformed on the two side surfaces, the upper surface, and the lowersurface of the first semiconductor region through a first gateinsulating film and having the <110> direction as a channel lengthdirection thereof and a first source/drain region formed on the firstsemiconductor region to interpose the first gate electrode therebetween;a second semiconductor region having two side surfaces, an upper surfaceand a lower surface along the <110> direction on the insulator layer,one of the upper surface and each of the two side surfaces having a(110) surface, and the second semiconductor region being made of SiGe orGe having a uniaxial compressive strain in the <110> direction; and ap-channel MIS transistor formed on the second semiconductor region, thep-channel MIS transistor including a second gate electrode formed on thetwo side surfaces, the upper surface and the lower surface of the secondsemiconductor region through a second gate insulating film and havingthe <110> direction as a channel length direction thereof and a secondsource/drain region formed on the second semiconductor region tointerpose the first gate electrode therebetween.
 2. The device accordingto claim 1, wherein the upper surface of each of the first semiconductorregion and the second semiconductor region is a (001) surface.
 3. Thedevice according to claim 1, wherein the upper surface of each of thefirst semiconductor region and the second semiconductor region is a(110) surface.
 4. The device according to claim 1, wherein a width ofeach of the first semiconductor region and the second semiconductorregion perpendicular to the longitudinal direction thereof falls withinthe range of 5 nm to 500 nm, each limit inclusive.
 5. The deviceaccording to claim 1, wherein the two side surfaces of each of the firstsemiconductor region and the second semiconductor region are (110)surfaces.
 6. The device according to claim 1, wherein a strain amount ofeach of the unixaial tensile strain and the uniaxial compressive strainis 0.4% or above.
 7. The device according to claim 1, wherein a strainamount of each of the unixaial tensile strain and the uniaxialcompressive strain is 0.8% or above.
 8. The device according to claim 1,wherein the two side surfaces of each of the first semiconductor regionand the second semiconductor region are (001) surfaces, and the uppersurface of each of the first semiconductor region and the secondsemiconductor region is the (110) surface.
 9. A semiconductor devicecomprising: an insulator layer; a first semiconductor region having afirst surface along a <110> direction on the insulator layer, the firstsurface having a (110) surface, and the first semiconductor region beingmade of Si having a uniaxial tensile strain in the <110> direction; ann-channel MIS transistor formed on the first semiconductor region, then-channel MIS transistor including a first gate electrode formed on atleast the first surface of the first semiconductor region through afirst gate insulating film and having the <110> direction as a channellength direction thereof and a first source/drain region formed on thefirst semiconductor region to interpose the first gate electrodetherebetween; a second semiconductor region having a second surfacealong the <110> direction on the insulator layer, the second surfacehaving a (110) surface, and the second semiconductor region being madeof SiGe or Ge having a uniaxial compression strain in the <110>direction; and a p-channel MIS transistor formed on the secondsemiconductor region, the p-channel MIS transistor including a secondgate electrode formed on the second surface of the second semiconductorregion through a second gate insulating film and having the <110>direction as a channel length direction thereof and a secondsource/drain region formed on the second semiconductor region tointerpose the first gate electrode therebetween.
 10. The deviceaccording to claim 9, wherein the first surface is an upper surface ofthe first semiconductor region and the second surface is an uppersurface of the second semiconductor region.
 11. The device according toclaim 10, wherein side surfaces of the first semiconductor region andthe second semiconductor region are (001) surfaces.
 12. The deviceaccording to claim 9, wherein the first surface is a side surface of thefirst semiconductor region and the second surface is a side surface ofthe second semiconductor region.
 13. The device according to claim 12,wherein each of an upper surface of the first semiconductor region andthe second semiconductor region is a (001) surface.
 14. The deviceaccording to claim 9, wherein a width of each of the first semiconductorregion and the second semiconductor region perpendicular to thelongitudinal direction thereof falls within the range of 5 nm to 500 nm,each limit inclusive.
 15. The device according to claim 9, wherein astrain amount of each of the uniaxial tensile strain and the uniaxialcompressive strain is 0.4% or above.
 16. The device according to claim9, wherein a strain amount of each of the uniaxial tensile strain andthe uniaxial compressive strain is 0.8% or above.
 17. A semiconductordevice comprising: an insulator layer; and an n-channel MIS transistorhaving an n-channel and a p-channel MIS transistor having a p-channelwhich are formed on the insulator layer, each of the n-channel and thep-channel having a (110) surface along a channel length direction,wherein the n-channel of the n-channel MIS transistor is formed of a Silayer having a uniaxial tensile strain in the channel length direction,the p-channel of the p-channel MIS transistor is formed of a SiGe or Gelayer having a uniaxial compressive strain in the channel lengthdirection, and the channel length direction of each of the n-channel MIStransistor and the p-channel MIS transistor is a <110> direction. 18.The device according to claim 17, wherein an upper surface of each ofthe Si layer and the SiGe or Ge layer is the (110) surface.